Center for Power Electronics Systems, Virginia Tech, Blacksburg, VA 24060, United States; Department of Electrical and Engineering, University of Johannesburg, Johannesburg 2006, South Africa
Wang, S., Center for Power Electronics Systems, Virginia Tech, Blacksburg, VA 24060, United States; Van Wyk, J.D., Center for Power Electronics Systems, Virginia Tech, Blacksburg, VA 24060, United States, Department of Electrical and Engineering, University of Johannesburg, Johannesburg 2006, South Africa; Lee, F.C., Center for Power Electronics Systems, Virginia Tech, Blacksburg, VA 24060, United States
This paper first analyzes the electrical parameters of differential-mode (DM) and common-mode (CM) propagation on power interconnects. The impedance-transformation effects of the power interconnects are then investigated. The interactions between the parasitic parameters in electromagnetic-interference (EMI) filters and the transformed impedances by the power interconnects are explored in detail. It is found that the interactions can degrade EMI-filter performance at high frequencies. Simulations and experiments are finally carried out to verify the analysis. © 2007 IEEE.